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3D-Micromac AG Germany
microPREP PRO
Safematic GmbH
CCU-010 HV high compact vacuum coating system
CCU-010 LV low compact vacuum coating system
Xei Scientific USA
EVACTRON® MODEL E16 PLASMA DE-CONTAMINATOR™
EVACTRON® MODEL E50 PLASMA DE-CONTAMINATOR™
EVACTRON® MODEL ES PLASMA DE-CONTAMINATOR™
Well Diamond Wire Saws Inc. USA
DIAMOND WIRE SAW SERIE 3000
DIAMOND WIRE SAW SERIE 4000
DIAMOND WIRE SAW SERIE 6000
Spicer Consulting Limited UK
SC22 Magnetic Field Cancelling System
SC24 Magnetic Field Cancelling System
SC26 Magnetic Field Cancelling System
SC11 Compact Analysis System
SC11 Sensor Interface Analysis System
SC11 Auto Survey System
Creative Design Engineering Inc. USA
Up to 8″ ResMap 178
Up to 8″ ResMap 178 Solar
Up to 12″ ResMap 273
Up to 8″ ResMap 168
Up to 8″ ResMap 168 Solar
Up to 12″ ResMap 463 FOUP
Up to 12″ ResMap 463 OC
Up to 8″ ResMap 468 SMIF
Gatan Inc. USA
PIPS II System
Dimple Grinder II
Solarus II Plasma Cleaner
Disc Punch
Disc Grinder
Ultrasonic Cutter
Cross Section Kit
PECS II System
ILION II SYSTEM Ilion II System
Moorfield Nanotechnology Limited UK
nanoPVD-S10A-WA
nanoPVD-S10A
nanoPVD-ST15A
MiniLab 026
MiniLab 060
MiniLab 080
MiniLab 090
MiniLab 125
nanoCVD-WG(P)
nanoCVD-8G
nanoETCH
Jandel Engineering Ltd UK
Jandel Cylindrical Four Point Probe
KLA-Tencor-Prometrix
CDE ResMap
AIT
Napson
Napson Miniature
VEECO-Cartridge with lead
Alessi-Compact Probe
Jandel RM3000+ Test Unit
Jandel ResTest Test Unit
Jandel HM21 Test Unit
Jandel Multiheight Four Point Probe Stand
Jandel Microposition Probe Stand
Jandel Multiheight/Microposition Probe Stand
Jandel Multiposition Wafer Probe Stand
Jandel Universal Probe Station
Jandel Hand Applied Probe
Jandel Reference Sample
Jandel General Purpose System
Jandel Multipurpose Four Point Probe System
Jandel Wafer Probing System
Jandel Portable Probing System
Application
Laser Micromachining
microPREP PRO
Chemical Vapour Deposition
nanoCVD-WG(P)
nanoCVD-8G
Plasma Etch
nanoETCH
MiniLab 026
Vacuum Coating
CCU-010 HV high compact vacuum coating system
CCU-010 LV low compact vacuum coating system
SEM Specimen Preparation
PECS II System
ILION II SYSTEM Ilion II System
Solarus II Plasma Cleaner
Downstream Plasma Cleaning / Plasma De-Contaminators
EVACTRON® MODEL E16 PLASMA DE-CONTAMINATOR™
EVACTRON® MODEL E50 PLASMA DE-CONTAMINATOR™
EVACTRON® MODEL ES PLASMA DE-CONTAMINATOR™
Diamond Wire Saw
DIAMOND WIRE SAW SERIE 3000
DIAMOND WIRE SAW SERIE 4000
DIAMOND WIRE SAW SERIE 6000
Magnetic Field Cancellation
SC22 Magnetic Field Cancelling System
SC24 Magnetic Field Cancelling System
SC26 Magnetic Field Cancelling System
SC11 Compact Analysis System
SC11 Sensor Interface Analysis System
SC11 Auto Survey System
TEM Specimen Preparation
PIPS II System
Dimple Grinder II
Solarus II Plasma Cleaner
Disc Punch
Disc Grinder
Ultrasonic Cutter
Cross Section Kit
Wafer Resistivity and Thin Film Metrology
Up to 8″ ResMap 178
Up to 8″ ResMap 178 Solar
Up to 12″ ResMap 273
Up to 8″ ResMap 168
Up to 8″ ResMap 168 Solar
Up to 12″ ResMap 463 FOUP
Up to 12″ ResMap 463 OC
Up to 8″ ResMap 468 SMIF
Physical Vapour Deposition
nanoPVD-S10A-WA
nanoPVD-S10A
nanoPVD-ST15A
MiniLab 026
MiniLab 060
MiniLab 080
MiniLab 090
MiniLab 125
Four Point Probe Sheet Resistivity Measurement
Jandel Cylindrical Four Point Probe
KLA-Tencor-Prometrix
CDE ResMap
AIT
Napson
Napson Miniature
VEECO-Cartridge with lead
Alessi-Compact Probe
Jandel RM3000+ Test Unit
Jandel ResTest Test Unit
Jandel HM21 Test Unit
Jandel Multiheight Four Point Probe Stand
Jandel Microposition Probe Stand
Jandel Multiheight/Microposition Probe Stand
Jandel Multiposition Wafer Probe Stand
Jandel Universal Probe Station
Jandel Hand Applied Probe
Jandel Reference Sample
Jandel General Purpose System
Jandel Multipurpose Four Point Probe System
Jandel Wafer Probing System
Jandel Portable Probing System
Services
TEM Sample Preparation
Magnetic Field Cancellation and Site Survey
Plasma De-contamination
Career
Contact
SEM Specimen Preparation
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